1. Y. Ma, T. Chantem, R. P. Dick, and X. S. Hu, “Improving Lifetime of Multicore Real-Time Systems Through Global Utilization Control,” in Proc. Great Lakes Symp. VLSI, May 2015.
  2. S. Arunachalam, T. Chantem, R. P. Dick, and X. S. Hu, “An online wear state monitoring methodology for off-the-shelf embedded processors,” in Proc. Int. Conf. Hardware/Software Codesign and System Synthesis, Oct. 2015, pp. 114–123. Notes: Software-only DVFS and temperature control based technique to measure changes in timing slack over time in microprocessors, enabling wear progression monitoring.
  3. J. Zhou, X. S. Hu, Y. Ma, and T. Wei, “Balancing lifetime and soft-error reliability to improve system availability,” Proc. Asia South Pacific Design Automation Conf., Jan. 2016, pp. 685–690.
  4. Y. Ma, T. Chantem, R. P. Dick, S. Wang, and X. S. Hu, “An on-line framework for improving reliability of real-time systems on `big-little’ type MPSoCs,” in Proc. Design, Automation & Test in Europe Conf., Mar. 2017, pp. 446–451.
  5. Y. Ma, T. Chantem, R. P. Dick, and X. S. Hu, “Improving system-level lifetime reliability of multicore soft real-time systems,” IEEE Trans. VLSI Systems, vol. 25, no. 6, pp. 1895–1905, June 2017. Notes: On-line methods of optimizing homogeneous
    multicore system reliability, considering thermal effects.
  6. Y. Ma, T. Chantem, R. P. Dick, and X. S. Hu, “Improving reliability for real-time systems through dynamic recovery,” in Proc. Design, Automation & Test in Europe Conf., Mar. 2018, pp. 515–520.
  7. Y. Ma, J. Zhou, T. Chantem, R. P. Dick, S. Wang, and X. S. Hu, “On-Line Resource Management for Improving Reliability of Real-Time Systems on `Big–Little’ Type MPSoCs,” IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems, 2019, preprint. Scheduled for printing in 2019.
  8. Other publications are currently under review and therefore cannot yet be released here, as it would violate the blind review process.