Reliability Driven Resource Management of Multi-Core Real-Time Embedded Systems

  • On-line wear measurement
    On-line wear measurements of embedded microprocessor boards, using DVFS control based fault generation to determine critical timing path.

National Science Foundation small project CNS-1319718/1319784/1319904 focused on developing algorithms and analysis techniques to improve reliability in real-time systems subject to both permanent faults resulting from temperature-dependent wear processes and transient faults resulting from strikes by high-energy subatomic particles. This project developed techniques to measure the wear progression in microprocessors using only software; algorithms to improve the reliability of embedded systems containing heterogeneous compute cores and graphics processing units; and analysis techniques for estimating fault probabilities in integrated circuits subject to a variety of lifetime wear processes and transient faults, including spatially heterogeneous faults resulting from within-package high-energy particle emission.